Simulated Annealing Based Strategy for Test Redundancy Reduction

Kamal Z., Zamli and Mohd Hafiz, Mohd Hassin and Al-Kazemi, Basem and Naseer, Atif (2014) Simulated Annealing Based Strategy for Test Redundancy Reduction. In: Proceedings of the 13th International Conference on Intelligent Software Methodologies, Tools, and Techniques (SOMET_14), 22-24 September 2014 , Langkawi. pp. 818-832..

[img] PDF
somet201459.pdf - Published Version
Restricted to Repository staff only

Download (280kB) | Request a copy

Abstract

Software testing relates to the process of accessing the functionality of a program against some defined specifications. To ensure conformance, test engineers often generate a set of test cases to validate against the user requirements. When dealing with large line of codes (LOCs), there are potentially issue of redundancies as new test cases may be added and old test cases may be deleted during the whole testing process. In order to address this issue, we have developed a new strategy, called tReductSA, to systematically minimize test cases for testing consideration. Unlike existing works which rely on the Greedy approaches, our work adopts the random sequence permutation and optimization algorithm based on Simulated Annealing with systematic merging technique. Our benchmark experiments demonstrate that tReductSA scales well with existing works (including that of GE, GRE and HGS) as far as optimality is concerned. On the other note, tReductSA also offers more diversified solutions as compared to existing work.

Item Type: Conference or Workshop Item (Paper)
Additional Information: Publisher: IOS Press ISBN : 978-1-61499-433-6 (print); 978-1-61499-434-3 (online)
Subjects: Q Science > QA Mathematics > QA76 Computer software
Faculty/Division: Faculty of Computer System And Software Engineering
Depositing User: Prof. Dr. Kamal Zuhairi Zamli
Date Deposited: 21 Oct 2014 04:18
Last Modified: 15 Jan 2018 07:46
URI: http://umpir.ump.edu.my/id/eprint/7246
Download Statistic: View Download Statistics

Actions (login required)

View Item View Item