UMP Institutional Repository

Competing risk models in reliability systems, an exponetial distribution model with Bayesian analysis approach

Ismed, Iskandar (2017) Competing risk models in reliability systems, an exponetial distribution model with Bayesian analysis approach. In: 4th Asia Pacific Conference on Manufacturing Systems and the 3rd International Manufacturing Engineering Conference, APCOMS-iMEC 2017, 7-8 December 2017 , Yogyakarta, Indonesia. pp. 1-6., 319 (1). ISSN 17578981

[img] Pdf
59. Competing risk models in reliability systems, an exponetial distribution model with Bayesian analysis approach.pdf
Restricted to Repository staff only

Download (67kB) | Request a copy
[img]
Preview
Pdf
59.1 Competing risk models in reliability systems, an exponetial distribution model with Bayesian analysis approach.pdf

Download (24kB) | Preview

Abstract

The exponential distribution is the most widely used reliability analysis. This distribution is very suitable for representing the lengths of life of many cases and is available in a simple statistical form. The characteristic of this distribution is a constant hazard rate. The exponential distribution is the lower rank of the Weibull distributions. In this paper our effort is to introduce the basic notions that constitute an exponential competing risks model in reliability analysis using Bayesian analysis approach and presenting their analytic methods. The cases are limited to the models with independent causes of failure. A non-informative prior distribution is used in our analysis. This model describes the likelihood function and follows with the description of the posterior function and the estimations of the point, interval, hazard function, and reliability. The net probability of failure if only one specific risk is present, crude probability of failure due to a specific risk in the presence of other causes, and partial crude probabilities are also included.

Item Type: Conference or Workshop Item (Lecture)
Additional Information: Indexed by Scopus
Uncontrolled Keywords: Reliability systems; Bayesian analysis
Subjects: T Technology > TS Manufactures
Faculty/Division: Faculty of Manufacturing Engineering
Depositing User: Pn. Hazlinda Abd Rahman
Date Deposited: 13 Jul 2018 07:43
Last Modified: 13 Jul 2018 07:43
URI: http://umpir.ump.edu.my/id/eprint/21217
Download Statistic: View Download Statistics

Actions (login required)

View Item View Item