Intermetallic Evolution for Isothermal Aging Up To 2000hours on Sn-4ag-0.5cu and Sn-37pb Solders with Ni/Au Layers

Siti Rabiatull Aisha, Idris and Azmah Hanim, Mohamad Ariff and Ourdjini, Ali and Saliza Azlina, Osman (2013) Intermetallic Evolution for Isothermal Aging Up To 2000hours on Sn-4ag-0.5cu and Sn-37pb Solders with Ni/Au Layers. International Journal of Automotive and Mechanical Engineering (IJAME), 8. pp. 1348-1356. ISSN 1985-9325(Print); 2180-1606 (Online). (Published)

PDF (fkm-2013-rabiatul-IntermetallicEvolution)
P184.pdf
Restricted to Repository staff only
Download (1MB) | Request a copy

DOI/Official URL: http://ijame.ump.edu.my/images/Volume_8/22_Azmah%2...

Abstract

Reliability of a solder joint is closely related to the intermetallic compound formation during the joining process and its evolution after exposure to heat. Throughout this paper, interfacial reactions between Sn-4Ag-0.5Cu solders and Sn-37Pb solders with electroless nickel immersion gold (Ni/Au) surface finish were studied. Few of the parameters are solder type, thickness of nickel layer and aging time. The results focused on type of intermetallic compound formed and the intermetallic thickness. Aging changed the intermetallic morphology to become rounder, bigger and more compact with time. Aged Sn-4Ag-0.5Cu solders on Ni/Au exhibit the tendency for the intermetallic to change from (Cu,Ni)6Sn5 to (Ni,Cu)3Sn4 and finally Ni3Sn4. The results also showed that, with the parameters used in this experiment, nickel thickness 3micrometer is adequate to be a good diffusion barrier up to 2000hours aging time. In Sn-37Pb, redeposition of (Au,Ni)Sn4 intermetallic start after 500hour

Item Type:	Article
Additional Information:	Indexed in Scopus
Uncontrolled Keywords:	Ni/Au, Lead free solders; Isothermal aging; Interfacial reaction; Sn-4Ag-0.5Cu; Sn-37Pb
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Faculty/Division:	Faculty of Mechanical Engineering
Depositing User:	azimah
Date Deposited:	24 Mar 2014 06:47
Last Modified:	15 Jan 2018 08:10
URI:	http://umpir.ump.edu.my/id/eprint/4004
Download Statistic:	View Download Statistics

Actions (login required)

View Item