UMP Institutional Repository

Effect of different cooling rate on integrated circuit (ic) package

Amir Syahmi, Nordin (2013) Effect of different cooling rate on integrated circuit (ic) package. Faculty of Mechanical Engineering , Universiti Malaysia Pahang.

[img]
Preview
PDF
CD8031_@_56.pdf

Download (4MB)

Abstract

Currently, electronic products have shrunk into smaller size and in order to increase the input/output (I/O) counts as well as to improve performance. The goal of this study is to determine the reliability and strength of the solder joint formed at the integrated circuit (IC) interconnection with the board. The strength of the joint is based on the intermetallic compound (IMC) formation at the joint. Free lead based solders have been used nowadays due to the environmental and health hazard effect of the lead based solder. Two types of surface finish have been used in this study which was electroless/nickel immersion gold (ENIG) and bare copper substrate as the reference in the research. All specimens will be subjected to reflow soldering with slow and fast cooling rate apply on the sample. Then, all specimens will undergo isothermal ageing at 150°C for 250 hour and 500 hour. The IMC formed at the solder joints of all specimens were studied in terms of thickness and cooling rate applied on it. Characterization on the specimen is done by the cross section of the joint to see the IMC formation on the solder joint. It can be concluded that, the fast cooling rate forms large IMC compared to slow cooling rate which is much thinner than fast cooling rate. Besides that, it was found that IMCs thicknesses are proportional with ageing durations. However, thicker IMC was found on the bare copper substrate joint compare to ENIG surface joint after ageing treatment, indicating higher growth rate of IMCs formed at the bare cooper substrate

Item Type: Undergraduates Project Papers
Additional Information: Project paper (Bachelor of Mechanical Engineering (Automotive) -- Universiti Malaysia Pahang - 2013
Uncontrolled Keywords: Integrated circuits;Semiconductors
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Faculty/Division: Faculty of Mechanical Engineering
Depositing User: Muhamad Firdaus Janih@Jaini
Date Deposited: 16 Nov 2015 00:34
Last Modified: 16 Nov 2015 00:34
URI: http://umpir.ump.edu.my/id/eprint/8391
Download Statistic: View Download Statistics

Actions (login required)

View Item View Item