Items where Author is "Batool, Uzma"
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Batool, Uzma and Mohd Ibrahim, Shapiai and Mostafa, Salama A. and Mohd Zamri, Ibrahim (2023) An attention-augmented convolutional neural network with focal loss for mixed-type wafer defect classification. IEEE Access, 11. 108891 -108905. ISSN 2169-3536. (Published)