Items where Author is "Yuen, Edmund"

Article

Jessnor Arif, Mat Jizat and Anwar, P. P. Abdul Majeed and Ahmad Fakhri, Ab. Nasir and Zahari, Taha and Yuen, Edmund (2021) Evaluation of the machine learning classifier in wafer defects classification. ICT Express. pp. 1-5. ISSN 2405-9595. (In Press / Online First) (In Press / Online First)

Jessnor Arif, Mat Jizat and Ahmad Fakhri, Ab. Nasir and Anwar P. P., Abdul Majeed and Yuen, Edmund (2020) Effect of image compression using fast fourier transformation and discrete wavelet transformation on transfer learning wafer defect image classification. Mekatronika - Journal of Intelligent Manufacturing & Mechatronics, 2 (1). pp. 16-22. ISSN 2637-0883. (Published)

Conference or Workshop Item

Ismail, Mohd Khairuddin and Lim, Shi Xuen and Mohd Azraai, Mohd Razman and Jessnor Arif, Mat Jizat and Yuen, Edmund and Jiang, Haochuan and Yap, Eng Hwa and Anwar, P. P. Abdul Majeed (2023) The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation. In: Robot Intelligence Technology and Applications 7: RiTA 2022 , 7-9 December 2022 , Daejeon, Korea. pp. 304-309., 642. ISBN 978-3-031-26889-2 (Published)

Jessnor Arif, Mat Jizat and Anwar, P. P. Abdul Majeed and Ahmad Fakhri, Ab. Nasir and Zahari, Taha and Yuen, Edmund and Lim, Shi Xuen (2022) Evaluation of the Transfer Learning Models in Wafer Defects Classification. In: Recent Trends in Mechatronics Towards Industry 4.0: Selected Articles from iM3F 2020, Malaysia , 6 August 2020 , Universiti Malaysia Pahang (Virtual). pp. 873-881., 730. ISBN https://doi.org/10.1007/978-981-33-4597-3_78 (Published)