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Items where Author is "Yuen, Edmund"

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Jessnor Arif, Mat Jizat and Anwar, P. P. Abdul Majeed and Ahmad Fakhri, Ab. Nasir and Zahari, Taha and Yuen, Edmund (2021) Evaluation of the machine learning classifier in wafer defects classification. ICT Express. pp. 1-5. ISSN 2405-9595 (In Press)

Jessnor Arif, Mat Jizat and Ahmad Fakhri, Ab. Nasir and Anwar P. P., Abdul Majeed and Yuen, Edmund (2020) Effect of image compression using fast fourier transformation and discrete wavelet transformation on transfer learning wafer defect image classification. Mekatronika - Journal of Intelligent Manufacturing & Mechatronics, 2 (1). pp. 16-22. ISSN 2637-0883

This list was generated on Sun Feb 5 16:26:50 2023 +08.