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Ismail, Mohd Khairuddin and Lim, Shi Xuen and Mohd Azraai, Mohd Razman and Jessnor Arif, Mat Jizat and Yuen, Edmund and Jiang, Haochuan and Yap, Eng Hwa and Anwar, P. P. Abdul Majeed (2023) The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation. In: Robot Intelligence Technology and Applications 7: RiTA 2022 , 7-9 December 2022 , Daejeon, Korea. pp. 304-309., 642. ISBN 978-3-031-26889-2 (Published)