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Ismail, Mohd Khairuddin and Lim, Shi Xuen and Mohd Azraai, Mohd Razman and Jessnor Arif, Mat Jizat and Yuen, Edmund and Jiang, Haochuan and Yap, Eng Hwa and Anwar, P. P. Abdul Majeed (2023) The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation. In: Robot Intelligence Technology and Applications 7: RiTA 2022 , 7-9 December 2022 , Daejeon, Korea. pp. 304-309., 642. ISBN 978-3-031-26889-2 (Published)

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Jessnor Arif, Mat Jizat and Anwar, P. P. Abdul Majeed and Ahmad Fakhri, Ab. Nasir and Zahari, Taha and Yuen, Edmund and Lim, Shi Xuen (2022) Evaluation of the Transfer Learning Models in Wafer Defects Classification. In: Recent Trends in Mechatronics Towards Industry 4.0: Selected Articles from iM3F 2020, Malaysia , 6 August 2020 , Universiti Malaysia Pahang (Virtual). pp. 873-881., 730. ISBN https://doi.org/10.1007/978-981-33-4597-3_78 (Published)

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Lim, Shi Xuen (2023) The formulation of a transfer learning pipeline for the classification of the wafer defects. Masters thesis, Universiti Malaysia Pahang Al-Sultan Abdullah (Contributors, Thesis advisor: Ismail, Mohd Khairuddin).