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Conference or Workshop Item
Jessnor Arif, Mat Jizat and Anwar, P. P. Abdul Majeed and Ahmad Fakhri, Ab. Nasir and Zahari, Taha and Yuen, Edmund and Lim, Shi Xuen (2022) Evaluation of the Transfer Learning Models in Wafer Defects Classification. In: Recent Trends in Mechatronics Towards Industry 4.0: Selected Articles from iM3F 2020, Malaysia , 6 August 2020 , Universiti Malaysia Pahang (Virtual). pp. 873-881., 730. ISBN https://doi.org/10.1007/978-981-33-4597-3_78 (Published)