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Mahmood, Ahmed and Hashim, Yasir and Hadi, Manap (2018) Nano-dimensional properties of Si-FinFET transistor based on ION/IOFF ratio and subthreshold swing (SS). Journal of Nanoscience and Technology, 4 (4). pp. 431-434. ISSN 2455-0191. (Published)
Atalla, Yousif and Hashim, Yasir and Abdul Nasir, Abd Ghafar (2018) Temperature sensitivity based on channel length of FinFET transistor. Journal of Nanoscience and Technology, 4 (1). pp. 338-341. ISSN 2455-0191. (Published)