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X-Ray Topography

Hartwig, J. B. and Hartwig, J. and S. N., Aqida (2016) X-Ray Topography. In: Reference Module in Materials Science and Materials Engineering. Elsevier, Oxford, pp. 1-9. ISBN 978-0-12-803581-8

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Abstract

X-ray topography is a nondestructive technique to characterize strain and visualize inhomogeneties, imperfections, and distortions in crystals. This article presents X-ray topography fundamentals, basic technique, and simulation. In principle, the topographic information produced by diffracted X-ray beam when the Bragg condition is satisfied. Among the basic extended beam methods are integrated wave and plane wave topography. The integrated wave method includes white beam X-ray topography which is the Laue technique with low divergent, powerful, and broad incident beam. The advent of synchrotron radiation topography permits a fast and detailed study of defects in crystalline materials.

Item Type: Book Section
Uncontrolled Keywords: Borrmann effect; Bragg diffraction; Dislocation; Dynamical theory; Lattice distortion; Laue technique; Plane wave topography; Synchrotron radiation (SR) X-ray topography; White-beam X-ray topography
Subjects: T Technology > TJ Mechanical engineering and machinery
Faculty/Division: Faculty of Mechanical Engineering
Depositing User: Noorul Farina Arifin
Date Deposited: 18 Jan 2017 07:27
Last Modified: 22 Jan 2018 06:14
URI: http://umpir.ump.edu.my/id/eprint/16224
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