Temperature Effect on ON/OFF Current Ratio of FinFET Transistor

Hashim, Yasir (2017) Temperature Effect on ON/OFF Current Ratio of FinFET Transistor. In: 2017 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) , 23-25 August 2017 , Batu Ferringhi, Malaysia. pp. 231-234. (172623). ISBN 978-1-5090-4029-2

[img]
Preview
PDF
ftech-2017-yasir-Temperature Effect on ONOFF1.pdf

Download (148kB) | Preview
[img] PDF
ftech-2017-yasir-Temperature Effect on ONOFF.pdf
Restricted to Repository staff only

Download (272kB) | Request a copy

Abstract

This paper demonstrates the working temperature effect on ON/OFF current ratio of FinFET transistor and the prospect of using it as a temperature nano-sensor. The characteristics of the FinFET transistors were simulated using MUGFET simulation tool at different working temperature. Output characteristics with a working temperature range (-25oC to 125oC) were simulated. Variation of ON current to OFF current ratio (Ion/Ioff) with working temperature was investigated.

Item Type: Conference or Workshop Item (Lecture)
Uncontrolled Keywords: Temperature, FinFETs, Silicon, Tools, Temperature sensors, Ions
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Faculty/Division: Faculty of Engineering Technology
Depositing User: Dr. Yasir Hashim Naif
Date Deposited: 07 Dec 2017 00:58
Last Modified: 07 Dec 2017 00:58
URI: http://umpir.ump.edu.my/id/eprint/19250
Download Statistic: View Download Statistics

Actions (login required)

View Item View Item