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Agha, Firas Natheer Abdul-kadir and Hashim, Yasir and Shakib, Mohammed Nazmus (2020) Temperature Impact on The ION/IOFF Ratio of Gate All Around Nanowire TFET. In: IEEE International Conference on Semiconductor Electronics (ICSE), 28-29 July, 2020 , Kuala Lumpur, Malaysia. pp. 1-4.. ISBN 978-1-7281-5968-3

This list was generated on Fri Oct 22 04:05:43 2021 +08.