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Number of items: 4.

Atalla, Yousif and Hashim, Yasir and Abdul Nasir, Abd Ghafar (2022) The impact of channel fin width on electrical characteristics of Si-FinFET. International Journal of Electrical and Computer Engineering (IJECE), 12 (1). pp. 201-207. ISSN 2088-8708. (Published)

Atalla, Yousif and Hashim, Yasir and Abdul Nasir, Abd Ghafar and Jabbar, Waheb A. (2020) Temperature characteristics of FinFET based on channel fin width and working voltage. International Journal of Electrical and Computer Engineering (IJECE), 10 (6). pp. 5650-5657. ISSN 2088-8708. (Published)

Atalla, Yousif and Hashim, Yasir and Abdul Nasir, Abd Ghafar and Jabbar, Waheb A. (2019) A temperature characterization of (Si-FinFET) based on channel oxide thickness. TELKOMNIKA (Telecommunication Computing Electronics and Control), 17 (5). pp. 2475-2480. ISSN 1693-6930. (Published)

Atalla, Yousif and Hashim, Yasir and Abdul Nasir, Abd Ghafar (2018) Temperature sensitivity based on channel length of FinFET transistor. Journal of Nanoscience and Technology, 4 (1). pp. 338-341. ISSN 2455-0191. (Published)

This list was generated on Fri Mar 29 08:22:14 2024 +08.