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Atalla, Yousif and Hashim, Yasir and Abdul Nasir, Abd Ghafar and Jabbar, Waheb A. (2019) A temperature characterization of (Si-FinFET) based on channel oxide thickness. TELKOMNIKA (Telecommunication Computing Electronics and Control), 17 (5). pp. 2475-2480. ISSN 1693-6930

Atalla, Yousif and Hashim, Yasir and Abdul Nasir, Abd Ghafar (2018) Temperature sensitivity based on channel length of FinFET transistor. Journal of Nanoscience and Technology, 4 (1). pp. 338-341. ISSN 2455-0191

This list was generated on Wed Jan 20 21:30:07 2021 +08.