Evaluation of back-side slits with sub-millimeter resolution using a differential AMR probe

M. A. H. P., Zaini and Mohd Mawardi, Saari and Nurul A’in, Nadzri and Aiman, Mohd Halil and A. J. S., Hanifah and Tsukada, Keiji Evaluation of back-side slits with sub-millimeter resolution using a differential AMR probe. In: Lecture Notes in Electrical Engineering; 11th National Technical Symposium on Unmanned System Technology, NUSYS 2019 , 2 - 3 December 2019 , Kuantan, Malaysia. 319 -328., 666. ISSN 1876-1100 ISBN 978-981155280-9

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Abstract

The electromagnetic method of the Non-destructive Test is one of the approaches in the field of crack detection on a metallic sample. One of the techniques that appear in the electromagnetic method is the Eddy Current Testing (ECT), where it utilizes the electromagnetic principle to detect cracks in metallic components. In this research, an ECT probe that is made up of two AMR sensors, two excitation coils, and a developed set/reset circuit. Besides, a digital lock-in amplifier has also been developed by using NI-LabVIEW and a data acquisition (DAQ) card. A measurement system that incorporates the ECT probe and the digital lock-in amplifier as well as an amplifier circuit, a power supply, a PC and an XY stage to which the probe is attached to, is developed. Then, artificial slits with different depths from 768 µm to 929 µm are created on a galvanized steel plate sample. The slits are evaluated from the back-side of the galvanized steel plate via two types of scanning, which is the line scan and full map scanning. From the results of the line scan, the localization of the slits, as well as their depths, could be performed and estimated. Furthermore, 2-D mapping of the sample from the backside has been generated. The 2-D map shows that the position of the slits could be estimated, including their slits depths.

Item Type:	Conference or Workshop Item (Lecture)
Additional Information:	Indexed by Scopus
Uncontrolled Keywords:	AMR; Anisotropic magnetoresistance; ECT; Eddy Current Testing; NDT; Non-destructive testing
Subjects:	T Technology > TJ Mechanical engineering and machinery T Technology > TK Electrical engineering. Electronics Nuclear engineering
Faculty/Division:	Institute of Postgraduate Studies Faculty of Electrical and Electronic Engineering Technology Faculty of Mechanical & Manufacturing Engineering
Depositing User:	Mrs Norsaini Abdul Samat
Date Deposited:	17 Jul 2023 04:51
Last Modified:	17 Jul 2023 04:51
URI:	http://umpir.ump.edu.my/id/eprint/38038
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